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Analysis of the textual content of mined open source usability defect reports

conference contribution
posted on 2017-01-01, 00:00 authored by N S M Yusop, Jean-Guy SchneiderJean-Guy Schneider, John Grundy, Rajesh VasaRajesh Vasa
Writing a good usability defect report can be a tedious task, especially in identifying what important information should be included, and capturing the attention of software developers to fix them. This paper is a continuity of our previous studies investigating software development practitioners' day-to-day practices when dealing with usability defects. In this study, we mined 377 developer-tagged usability defect reports from Mozilla Thunderbird, Firefox for Android and Eclipse Platform to confirm what software development practitioners claimed to provide when reporting usability defects. We looked for the presence of key defect attributes - steps to reproduce, impact, software context, expected output, actual output, assumed causes, solution proposal and supplementary information. In addition, we analyzed the trend of different types of usability defects, correlation between usability defects and defect severity, and failure qualifier. Our findings demonstrate a mismatch between what software development practitioners claimed to provide when reporting usability defects, and the information that actually appears in the defect reports. The results of our research have important implications for software defect reporting, especially in designing more effective mechanisms for reporting usability defects.

History

Event

IEEE Computer Society. Conference (24th : 2017 : Nanjing, China)

Series

IEEE Computer Society Conference

Pagination

358 - 367

Publisher

Institute of Electrical and Electronics Engineers

Location

Nanjing, China

Place of publication

Piscataway, N.J.

Start date

2017-12-04

End date

2017-12-08

ISSN

1530-1362

ISBN-13

9781538636817

Language

eng

Publication classification

E Conference publication; E1 Full written paper - refereed

Copyright notice

2017, IEEE

Editor/Contributor(s)

Jian Lv, He Zhang, Mike Hinchey, Xiao Liu

Title of proceedings

APSEC 2017 : Proceedings of 24th Asia-Pacific Software Engineering Conference