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Depth estimation using multi-wavelet analysis based stereo vision approach

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conference contribution
posted on 2007-01-01, 00:00 authored by Asim BhattiAsim Bhatti, Saeid Nahavandi
The problem of dimensional defects in aluminum die- casting is widespread throughout the foundry industry and their detection is of paramount importance in maintaining product quality. Due to the unpredictable factory environment and metallic, with highly reflective, nature of aluminum die-castings, it is extremely hard to estimate true dimensionality of the die-casting, autonomously. In this work, we propose a novel robust 3D reconstruction algorithm capable of reconstructing dimensionally accurate 3D depth models of the aluminum die-castings. The developed system is very simple and cost effective as it consists of only a stereo cameras pair and a simple fluorescent light. The developed system is capable of estimating surface depths within the tolerance of 1.5 mm. Moreover, the system is invariant to illuminative variations and orientation of the objects in the input image space, which makes the developed system highly robust. Due to its hardware simplicity and robustness, it can be implemented in different factory environments without a significant change in the setup.

History

Event

International Conference on Wavelet Analysis and Pattern Recognition (2007: Beijing, China)

Pagination

1471 - 1476

Publisher

IEEE Xplore

Location

Beijing, China

Place of publication

Piscataway, N.J.

Start date

2007-11-02

End date

2007-11-04

ISBN-13

9781424410651

ISBN-10

1424410657

Language

eng

Notes

This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.

Publication classification

E1 Full written paper - refereed

Copyright notice

2007, IEEE

Editor/Contributor(s)

Institute of Electrical and Electronics Engineers

Title of proceedings

Wavelet analysis and pattern recognition