File(s) under permanent embargo
Describing data quality problems in business intelligence systems through a metadata framework
conference contribution
posted on 2012-01-01, 00:00 authored by William YeohWilliam Yeoh, T W Wang, Y VerbitskiyDescribing data quality problems in business intelligence systems through a metadata framework
History
Event
Americas Conference on Information Systems (18th : 2012 : Seattle, Wash.)Pagination
1 - 10Publisher
AMCISLocation
Seattle, Wash.Place of publication
[Seattle, Wash.]Start date
2012-08-09End date
2012-08-12ISBN-13
9780615663463Language
engPublication classification
E1 Full written paper - refereedTitle of proceedings
AMCIS 2012 : Proceedings of the 18th Americas Conference on Information SystemsUsage metrics
Categories
No categories selectedKeywords
Licence
Exports
RefWorks
BibTeX
Ref. manager
Endnote
DataCite
NLM
DC