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On the repudiability of device identification and image integrity verification using sensor pattern noise
conference contribution
posted on 2010-12-01, 00:00 authored by Chang-Tsun LiChang-Tsun Li, C Y Chang, Y LiIn this work we study the power of the methods for digital device identification and image integrity verification, which rely on sensor pattern noise as device signatures, and the repudiability of the conclusions drawn from the information produced by this type of methods. We prove that the sensor pattern noise existing in the original images can be destroyed so as to confuse the investigators. We also prove that sensor pattern noise of device A can be easily embedded in the images produced by another device B so that the device identifier would mistakenly suggest that the images were produced by device A, rather than by B, and mislead forensic investigations. © Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering 2010.
History
Volume
41 LNICSTPagination
19 - 25Publisher DOI
ISSN
1867-8211ISBN-13
9783642115295ISBN-10
3642115292Publication classification
E1.1 Full written paper - refereedTitle of proceedings
Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications EngineeringUsage metrics
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No categories selectedKeywords
Science & TechnologyTechnologyComputer Science, Information SystemsComputer Science, Theory & MethodsEngineering, Electrical & ElectronicComputer ScienceEngineeringDigital Device IdentificationDigital ForensicsDigital InvestigationDigital EvidenceSensor Pattern NoiseIntegrity VerificationEXPOSING DIGITAL FORGERIES
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