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Ion-Induced Bending with Applications for High-Resolution Electron Imaging of Nanometer-Sized Samples
journal contribution
posted on 2021-11-02, 00:00 authored by S Zhang, V Garg, G Gervinskas, Ross MarceauRoss Marceau, E Chen, R G Mote, J FuIon-Induced Bending with Applications for High-Resolution Electron Imaging of Nanometer-Sized Samples
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Journal
ACS Applied Nano MaterialsVolume
4Issue
11Pagination
12745 - 12754Publisher
American Chemical Society (ACS)Location
Washington, D.C.Publisher DOI
ISSN
2574-0970eISSN
2574-0970Language
engPublication classification
C1 Refereed article in a scholarly journalUsage metrics
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ion-induced bending (IIB)transmission electron microscopy (TEM)atom probe tomography (APT)sample preparationfocused ion beam (FIB)cryogenic temperaturenanoparticlesScience & TechnologyTechnologyNanoscience & NanotechnologyMaterials Science, MultidisciplinaryScience & Technology - Other TopicsMaterials ScienceATOM-PROBE TOMOGRAPHYFIB LIFT-OUTSPECIMEN PREPARATIONNANOSTRUCTURESFABRICATIONINTERFACESSCIENCE
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