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Mining information from atom probe data

journal contribution
posted on 2015-12-01, 00:00 authored by J M Cairney, K Rajan, D Haley, B Gault, P A J Bagot, P-P Choi, P J Felfer, S P Ringer, Ross MarceauRoss Marceau, M P Moody
Whilst atom probe tomography (APT) is a powerful technique with the capacity to gather information containing hundreds of millions of atoms from a single specimen, the ability to effectively use this information creates significant challenges. The main technological bottleneck lies in handling the extremely large amounts of data on spatial-chemical correlations, as well as developing new quantitative computational foundations for image reconstruction that target critical and transformative problems in materials science. The power to explore materials at the atomic scale with the extraordinary level of sensitivity of detection offered by atom probe tomography has not been not fully harnessed due to the challenges of dealing with missing, sparse and often noisy data. Hence there is a profound need to couple the analytical tools to deal with the data challenges with the experimental issues associated with this instrument. In this paper we provide a summary of some key issues associated with the challenges, and solutions to extract or "mine" fundamental materials science information from that data.

History

Journal

Ultramicroscopy

Volume

159

Issue

Part 2

Pagination

324 - 337

Publisher

Elsevier

Location

Amsterdam, The Netherlands

ISSN

0304-3991

eISSN

1879-2723

Language

eng

Notes

1st International Conference on Atom Probe Tomography & Microscopy

Publication classification

C Journal article; C1.1 Refereed article in a scholarly journal

Copyright notice

2015, Elsevier